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Carrier-mediated antiferromagnetic interlayer exchange coupling in diluted magnetic semiconductor multilayers Ga$_{1-x}$Mn$_x$As/GaAs:Be

机译:载流子介导的反铁磁层间交换耦合   稀磁半导体多层膜Ga $ _ {1-x} $ mn $ _x $ as / Gaas:Be

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摘要

We use neutron reflectometry to investigate the interlayer exchange couplingbetween Ga$_{0.97}$Mn$_{0.03}$As ferromagnetic semiconductor layers separatedby non-magnetic Be-doped GaAs spacers. Polarized neutron reflectivity measuredbelow the Curie temperature of Ga$_{0.97}$Mn$_{0.03}$As reveals acharacteristic splitting at the wave vector corresponding to twice themultilayer period, indicating that the coupling between the ferromagneticlayers are antiferromagnetic (AFM). When the applied field is increased toabove the saturation field, this AFM coupling is suppressed. This behavior isnot observed when the spacers are undoped, suggesting that the observed AFMcoupling is mediated by charge carriers introduced via Be doping. The behaviorof magnetization of the multilayers measured by DC magnetometry is consistentwith the neutron reflectometry results.
机译:我们使用中子反射法研究了Ga $ _ {0.97} $ Mn $ _ {0.03} $ As铁磁半导体层之间的层间交换耦合,该层被非磁性Be掺杂GaAs隔离层隔开。在居里温度Ga $ _ {0.97} $ Mn $ _ {0.03} $ As下方测量的极化中子反射率揭示了在波矢处的特征分裂,该分裂对应于多层周期的两倍,表明铁磁层之间的耦合是反铁磁(AFM)。当施加的场增加到饱和场之上时,该AFM耦合被抑制。当未掺杂间隔物时未观察到此行为,这表明观察到的AFM耦合是由通过Be掺杂引入的载流子介导的。直流磁强法测得的多层膜的磁化行为与中子反射法测量结果一致。

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